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Phase Noise and Allan Deviation Test Sets

Symmetricom’s state-of-the-art phase noise and Allan deviation (ADEV) test sets enable customers to make accurate measurements between 1 – 30MHz quickly and easily. These test sets eliminate the complications of measurement calibration and offer a simple one box solution to characterize even the lowest noise references more accurately than ever before.

Over 20 years of research both at the National Institute of Standards and Technology (NIST) and in private industry have been dedicated to the research and development of Symmetricom's test sets. The 5120A and 5115A follow in the legacy established by the 5110A as being the worldwide standard for ADEV measurements. These new instruments also include industry-leading phase noise measurement capability.

Typically used to characterize high precision oscillators and atomic clocks, Symmetricom's test sets are designed to make accurate phase noise and ADEV measurements easily. To perform direct digital measurements of the device under test just connect the device under test and reference to the test set and press a green Start button – easy, accurate and cost effective, even in the most challenging environments.

5120A

High Performance Phase Noise and Allan Deviation Test Set. (1 – 30MHz)
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5115A

Phase Noise and Allan Deviation Test Set. (1 – 30MHz)
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